Analyzers and Detectors |
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STAIB INSTRUMENTS manufactures various types of charged particle analyzers and detectors |
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| Imaging RHEED analyzer and RHEED filter | RHEA-100 |
| AUGER, XPS, ELS, ISS and UPS analyzers | DESA-100 ESA-100 DESA150 ESA-100 |
| RHEA-100 | |
| Imaging analyzer for photoelectron emission microscopes (PEEM) | PEEM-IEF |
| Micro spot analyzer for site specific UPS on PEEM | PEEM-MAF |
| Imaging analyzers for scanning electron microscopes | SEM-IEF |
| Secondary electron detectors | SED-38 SCI-38 |