PEEM
Photo Emission
Electron Microscopy
PEEM System

 


oval and chemical
defects on GaAs
integrated
circuit
YBaCuO
superconductor
passivated
InP

layer deposited
by ablation
chemical image
of InP
crystal phases
on YBaCuO
growth defect
on YBaCuO

test
pattern
large defect
on GaAs
stressed
GaAs
integrated
circuit